BOTLAGUNTA PREETHISH NANDAN. Smart Semiconductor Testing Systems: Fusion of Embedded AI And Scalable Data Pipelines. Journal for ReAttach Therapy and Developmental Diversities, [S. l.], v. 6, n. 10s(2), p. 2140–2156, 2023. DOI: 10.53555/jrtdd.v6i10s(2).3601. Disponível em: https://jrtdd.com/index.php/journal/article/view/3601. Acesso em: 22 sep. 2025.